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IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test is cosponsored with the IEEE Council  on Electronic Design and Automation, IEEE Circuits and Systems Society, and the IEEE Solid State Circuits Society.

 

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Permission to reprint/republish this material for commercial, advertising, or promotional purposes or for creating new collective works for resale or redistribution must be obtained from IEEE by writing to the IEEE Intellectual Property Rights Office, 445 Hoes Lane, Piscataway, NJ 08854-4141 or [email protected]. Copyright 2012 IEEE. All rights reserved.

 

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Submission Information: Submit a Word, pdf, text, or PostScript version of your submission to Manuscript Central, https://mc.manuscriptcentral.com/dandt


Editorial: Unless otherwise stated, bylined articles and columns, as well as product and service descriptions, reflect the author�s or firm�s opinion. Inclusion in IEEE Design & Test does not necessarily constitute endorsement by IEEE. All submissions are subject to editing for style, clarity, and length.


IEEE Design & Test (ISSN 0740-7475) is published bimonthly by the Institute of Electrical and -Electronics -Engineers, Inc. Headquarters: 3 Park Avenue, 17th Floor, New York, NY 10016-5997 USA. Responsibility for the contents rests upon the authors and not upon the IEEE, the Society, or its members. IEEE Operations Center (for orders, subscriptions, address changes): 445 Hoes Lane, Piscataway, NJ 08854 USA. Telephone: +1 732 981 0060, +1 800 678 4333. Individual copies: IEEE members US$20.00 (first copy only), nonmembers US$141.00 per copy. Subscription Rates: Society members included with membership dues. Subscription rates available upon request. Copyright and reprint permissions: Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limits of U.S. Copyright law for the private use of patrons 1) those post-1977 articles that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923 USA; 2) pre-1978 articles without fee.

For other copying, reprint, or republication permission, write Copyrights and Permissions Department, IEEE Operations Center, 445 Hoes Lane, Piscataway, NJ 08854 USA. Copyright 2013 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Periodicals postage paid at New York, NY, and at additional mailing offices. Postmaster: Send address changes to IEEE Design & Test, IEEE Operations Center, 445 Hoes Lane, Piscataway, NJ 08854 USA. Canadian GST #125634188. Printed in U.S.A.

 

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MAGAZINE DETAILS

Subjects: Aerospace ; Bioengineering ; Communication, Networking & Broadcasting ; Components, Circuits, Devices & Systems ; Computing & Processing (Hardware/Software) ; Engineered Materials, Dielectrics & Plasmas ; Engineering Profession ; Fields, Waves & Electromagnetics ; General Topics for Engineers (Math, Science & Engineering) ; Geoscience ; Nuclear Engineering ; Photonics & Electro-Optics ; Power, Energy, & Industry Applications ; Signal Processing & Analysis ; Transportation

Published by: IEEE Council on Electronic Design and Automation
Publication Details: IEEE Design & Test
Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=54
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This site is maintained by:
IEEE D&T Information Editor

Theo Theocharides ([email protected]), University of Cyprus.