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IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test is cosponsored with the IEEE Council  on Electronic Design and Automation, IEEE Circuits and Systems Society, the IEEE Solid State Circuits Society and the Test Technology Technical Council.

 

 

 

 

This site is maintained by:
IEEE D&T Information Editor

Theo Theocharides ([email protected]), University of Cyprus.